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Yield and Reliability in Microwave Circuit and System Design Michael D. Meehan

Yield and Reliability in Microwave Circuit and System Design By Michael D. Meehan

Yield and Reliability in Microwave Circuit and System Design by Michael D. Meehan


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Summary

A reference for anyone involved with microwave design. It tackles the practical aspects of microwave statistical design and introduces statistical design techniques that encompass many different applications. This presentation focuses on two main example areas - microwave circuits and systems.

Yield and Reliability in Microwave Circuit and System Design Summary

Yield and Reliability in Microwave Circuit and System Design by Michael D. Meehan

This reference is for anyone involved with microwave design. It tackles the practical aspects of microwave statistical design and introduces statistical design techniques that encompass many different applications. This presentation focuses on two main example areas - microwave circuits and systems - but any application with a complex relation between design variables and performance and design variable uncertainty can benefit from statistical design.

Table of Contents

Yield; calculating yield; statistical sensitivity; yield optimization; statistical modeling; case studies and examples.

Additional information

NPB9780890065273
9780890065273
0890065276
Yield and Reliability in Microwave Circuit and System Design by Michael D. Meehan
New
Hardback
Artech House Publishers
1993-12-01
300
N/A
Book picture is for illustrative purposes only, actual binding, cover or edition may vary.
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