Introduction to Semiconductor Device Yield Modeling by Albert V.Ferris- Prabhu
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Introduction to Semiconductor Device Yield Modeling
Introduction to Semiconductor Device Yield Modeling
Summary
This text, the first of its kind, delivers a systematically organized introduction to the theory and practice of yield prediction. The book addresses the economic need for accurate yield prediction, and clarifies the important role it plays in the semiconductor industry.
Introduction to Semiconductor Device Yield Modeling Summary
Table of Contents
Yield. Fault Probability. Effect of Defect Sizes on the Fault Probability. Counting Techniques. Yield Equations. Defect Density and Scaling Rules. Yield Prediction. Yield With Redundancy. A Yield Comparison. Productivity. Conclusion. References.
Additional information
NPB9780890064504
9780890064504
0890064504
Introduction to Semiconductor Device Yield Modeling by Albert V.Ferris- Prabhu
New
Hardback
Artech House Publishers
1992-07-31
108
N/A
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