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Frontiers in Electronic Testing Books

Verification by Error Modeling By Katarzyna Radecka
Verification by Error Modelingby Katarzyna Radecka
New
$254.49
inc. GST
Fault Diagnosis of Analog Integrated Circuits By Prithviraj Kabisatpathy
Fault Diagnosis of Analog Integrated Circuitsby Prithviraj Kabisatpathy
New
$505.99
inc. GST
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies By Andrei Pavlov
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologiesby Andrei Pavlov
New
$357.99
inc. GST
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies By Andrei Pavlov
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologiesby Andrei Pavlov
New
$298.99
inc. GST
Digital Timing Measurements By Wolfgang Maichen
Digital Timing Measurementsby Wolfgang Maichen
New
$255.29
inc. GST
Testability Concepts for Digital ICs By F.P.M. Beenker
Testability Concepts for Digital ICsby F.P.M. Beenker
New
$358.89
inc. GST
Reasoning in Boolean Networks By Wolfgang Kunz
Reasoning in Boolean Networksby Wolfgang Kunz
New
$360.29
inc. GST
Efficient Branch and Bound Search with Application to Computer-Aided Design By Xinghao Chen
Efficient Branch and Bound Search with Application to Computer-Aided Designby Xinghao Chen
New
$248.39
inc. GST
Research Perspectives and Case Studies in System Test and Diagnosis By John W. Sheppard
Research Perspectives and Case Studies in System Test and Diagnosisby John W. Sheppard
New
$359.39
inc. GST
Elements of STIL By Gregory A. Maston
Elements of STILby Gregory A. Maston
New
$255.99
inc. GST
Exit Wounds By John Westermann
Exit Woundsby John Westermann
Good
$15.49
inc. GST
Data Mining and Diagnosing IC Fails By Leendert M. Huisman
Data Mining and Diagnosing IC Failsby Leendert M. Huisman
New
$307.59
inc. GST
Emerging Nanotechnologies By Mohammad Tehranipoor
Emerging Nanotechnologiesby Mohammad Tehranipoor
New
$411.69
inc. GST
Test Resource Partitioning for System-on-a-Chip By Vikram Iyengar
Test Resource Partitioning for System-on-a-Chipby Vikram Iyengar
New
$210.39
inc. GST
Formal Equivalence Checking and Design Debugging By Shi-Yu Huang
Formal Equivalence Checking and Design Debuggingby Shi-Yu Huang
New
$254.09
inc. GST
Formal Equivalence Checking and Design Debugging By Shi-Yu Huang
Formal Equivalence Checking and Design Debuggingby Shi-Yu Huang
New
$437.49
inc. GST
High Performance Memory Testing By R. Dean Adams
High Performance Memory Testingby R. Dean Adams
New
$254.39
inc. GST
On-Line Testing for VLSI By Michael Nicolaidis
On-Line Testing for VLSIby Michael Nicolaidis
New
$232.79
inc. GST
The Core Test Wrapper Handbook By Francisco da Silva
The Core Test Wrapper Handbookby Francisco da Silva
New
$220.29
inc. GST
Data Mining and Diagnosing IC Fails By Leendert M. Huisman
Data Mining and Diagnosing IC Failsby Leendert M. Huisman
New
$255.29
inc. GST
Research Perspectives and Case Studies in System Test and Diagnosis By John W. Sheppard
Research Perspectives and Case Studies in System Test and Diagnosisby John W. Sheppard
New
$253.99
inc. GST
Multi-Chip Module Test Strategies By Yervant Zorian
Multi-Chip Module Test Strategiesby Yervant Zorian
New
$254.19
inc. GST
Emerging Nanotechnologies By Mohammad Tehranipoor
Emerging Nanotechnologiesby Mohammad Tehranipoor
New
$363.99
inc. GST
Digital Timing Measurements By Wolfgang Maichen
Digital Timing Measurementsby Wolfgang Maichen
New
$356.89
inc. GST
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits By Manoj Sachdev
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuitsby Manoj Sachdev
New
$493.79
inc. GST
Advances in Electronic Testing By Dimitris Gizopoulos
Advances in Electronic Testingby Dimitris Gizopoulos
New
$534.89
inc. GST
Analog and Mixed-Signal Boundary-Scan By Adam Osseiran
Analog and Mixed-Signal Boundary-Scanby Adam Osseiran
New
$357.39
inc. GST
Design for AT-Speed Test, Diagnosis and Measurement By Benoit Nadeau-Dostie
Design for AT-Speed Test, Diagnosis and Measurementby Benoit Nadeau-Dostie
New
$365.09
inc. GST
Delay Fault Testing for VLSI Circuits By Angela Krstic
Delay Fault Testing for VLSI Circuitsby Angela Krstic
New
$359.49
inc. GST
Introduction to Advanced System-on-Chip Test Design and Optimization By Erik Larsson
Introduction to Advanced System-on-Chip Test Design and Optimizationby Erik Larsson
New
$302.59
inc. GST
Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation By Alfredo Benso
Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluationby Alfredo Benso
New
$255.29
inc. GST
From Contamination to Defects, Faults and Yield Loss By Jitendra B. Khare
From Contamination to Defects, Faults and Yield Lossby Jitendra B. Khare
New
$208.09
inc. GST
From Contamination to Defects, Faults and Yield Loss By Jitendra B. Khare
From Contamination to Defects, Faults and Yield Lossby Jitendra B. Khare
New
$252.79
inc. GST
A Designer's Guide to Built-In Self-Test By Charles E. Stroud
A Designer's Guide to Built-In Self-Testby Charles E. Stroud
New
$365.79
inc. GST
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits By Manoj Sachdev
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuitsby Manoj Sachdev
New
$300.59
inc. GST
Fault Diagnosis of Analog Integrated Circuits By Prithviraj Kabisatpathy
Fault Diagnosis of Analog Integrated Circuitsby Prithviraj Kabisatpathy
New
$233.49
inc. GST
Introduction to IDDQ Testing By S. Chakravarty
Introduction to IDDQ Testingby S. Chakravarty
New
$255.19
inc. GST
Design for AT-Speed Test, Diagnosis and Measurement By Benoit Nadeau-Dostie
Design for AT-Speed Test, Diagnosis and Measurementby Benoit Nadeau-Dostie
New
$256.19
inc. GST
Fault-Tolerance Techniques for SRAM-Based FPGAs By Fernanda Lima Kastensmidt
Fault-Tolerance Techniques for SRAM-Based FPGAsby Fernanda Lima Kastensmidt
New
$255.29
inc. GST
Fault-Tolerance Techniques for SRAM-Based FPGAs By Fernanda Lima Kastensmidt
Fault-Tolerance Techniques for SRAM-Based FPGAsby Fernanda Lima Kastensmidt
New
$253.29
inc. GST
The Core Test Wrapper Handbook By Francisco da Silva
The Core Test Wrapper Handbookby Francisco da Silva
New
$361.69
inc. GST
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits By M. Bushnell
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuitsby M. Bushnell
New
$272.69
inc. GST
Advances in Electronic Testing By Dimitris Gizopoulos
Advances in Electronic Testingby Dimitris Gizopoulos
New
$303.19
inc. GST
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits By M. Bushnell
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuitsby M. Bushnell
New
$325.99
inc. GST
Testability Concepts for Digital ICs By F.P.M. Beenker
Testability Concepts for Digital ICsby F.P.M. Beenker
New
$255.29
inc. GST
Analog and Mixed-Signal Boundary-Scan By Adam Osseiran
Analog and Mixed-Signal Boundary-Scanby Adam Osseiran
New
$320.79
inc. GST
Delay Fault Testing for VLSI Circuits By Angela Krstic
Delay Fault Testing for VLSI Circuitsby Angela Krstic
New
$252.79
inc. GST
Efficient Branch and Bound Search with Application to Computer-Aided Design By Xinghao Chen
Efficient Branch and Bound Search with Application to Computer-Aided Designby Xinghao Chen
New
$229.69
inc. GST